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Archive for the ‘Equipment’ Category

Proto iXRD

The iXRD from Proto is a dedicated XRD intended for measuring residual stress and retained austenite.  Equipped with both Co and Cr X-ray tubes, the iXRD is capable of handling steel and aluminum materials.  The system is stored in an enclosure and operated remotely via laptop using the XRDWin 2.0 software package, used for data collection as well as stress analysis.

 

Apreo FE-SEM

The Thermo Scientific™ Apreo scanning electron microscope’s (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.

The Apreo SEM benefits from the unique in-lens backscatter detection named the Trinity detector system, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples.

Apreo FE-SEM Basic Training – xT Software and Operation

JEOL 8600 EPMA

140740_080_MW_CAF_instrumentation

The JEOL 8600 EPMA is a tungsten sourced tool equipped with five WDS spectrometers, one Bruker XFlash EDS detector, one Gatan CL detector, in addition to SE and BSE imaging capability.  The instrument uses a combination of Probe for Windows and Bruker Esprit software for an array of analytical needs ranging from quantitative analysis to automated data collection and chemical mapping.

TESCAN LYRA FIB-FESEM

http://tescan.com/en/products/lyra-fib-fesem

Wet Preparation Facility (TEM)

Please note:

Specimen Wet Preparation has been moved to Bevill 160

Coating, Milling, and Other Non-Wet Preparation (SEM, TEM)

Description:

This laboratory contains instrument for preparing TEM and SEM samples for viewing. Instruments include: carbon evaporator, sputter coaters, ion mills.


Instruction downloads:

Cressington 208 Sputter Coater (PPT)
Plasma Cleaner (PPT)

FEI Tecnai F-20 Transmission Electron Microscope

Description:

FEI 200 kV transmission electron microscope equipped with a CCD camera for STEM, HAADF detector, and EDAX EDX.

TEM Training Guide

FEI Quanta 3D Dual Beam

Description:

This instrument has both and electron beam, for normal SEM operations, and ion beam milling and imaging samples. The e-beam column is sourced by a tungsten filament. The ion column is a gallium source. The instrument is also equipped with EDAX EDS system and TSL backscattered electron detector.

The instrument may also be used in an ESEM mode.

Quanta FIB Basic Training – Eucentric, Pt, Trenching

Quanta FIB Basic Training – xT Software

Related Links:

EDAX

JEOL 7000 FE Scanning Electron Microscope

Description:

The JEOL 7000 FE SEM is equipped with EDX, WDS, EBSD, SE, BE and TE detectors, plus Nabity E-beam lithography.

Operating Instructions:

Basic Operation (PPT)
Exploring the JEOL Program (PPT)
Intro to Oxford EDX (PPT)
Oxford Channel 5 User Manual (PDF)

Related Links:

Oxford Instruments
INCA TIPS (some useful tips when using the Oxford Inca system)
Nabity (Nano-Pattern Generation)
Microscopy Society of America
Royal Microscopy Society

IMAGO Local Electrode Atom Probe (LEAP)

Quantitative 3D Compositional Imaging and Analysis with Atomic Resolution

 

Instrument Description: (taken in part from Imago Scientific Instruments)
An atom probe specimen is a small pointed tip (microtip) with a ~100nm radius of curvature. A positive voltage is applied to the specimen causing ionization of the surface atoms. Under an applied voltage pulse or laser pulse, the positive ions are “evaporated” from the surface of the sample. Time-of-flight mass spectrometry identifies individual atoms by their elements or isotopes, while point-projection microscopy identifies where atoms were originally located in the specimen. The LEAP uses the principles of both time-of-flight mass spectroscopy and point-projection microscopy to identify individual elements and to locate them within the bulk of a material and build a 3-D image of sample material.

Cryo-System Shutdown and Restart Instructions

 

 Related Links:

CAMECA Instruments