Equipment & Instrumentation

(Click link for instrumentation and laboratory description)



X-ray Diffraction:

Bruker D8 Discover with GADDS


Atom Probe:

IMAGO Local Electrode Atom Probe (LEAP)


Scanning Electron Microscopes:

JEOL 7000 FE Scanning Electron Microscope


Focused Ion Beam:

FEI Quanta 3D Dual Beam


Transmission Electron Microscopes:

FEI Tecnai F-20 Transmission Electron Microscope


ESCA (XPS) – Auger Analysis:

Kratos Axis 165 XPS/Auger


Electron Probe Micro Analyzer (EPMA):

JEOL 8600 EPMA


Preparation Facilities:

Wet Preparation Facility (TEM)

Coating, Milling, and Other Non-Wet Preparation (SEM, TEM)