JEOL 7000 FE Scanning Electron Microscope

Description:

The JEOL 7000 FE SEM is equipped with EDX, WDS, EBSD, SE, BE and TE detectors, plus Nabity E-beam lithography.

Operating Instructions:

Basic Operation (PPT)
Exploring the JEOL Program (PPT)
Intro to Oxford EDX (PPT)
Oxford Channel 5 User Manual (PDF)

Related Links:

Oxford Instruments
INCA TIPS (some useful tips when using the Oxford Inca system)
Nabity (Nano-Pattern Generation)
Microscopy Society of America
Royal Microscopy Society